SPM/AFM Dimension 3100 - Status: Available
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Scanning Probe Microscope/ Atomic Force Microscope AFM is a high resolution, nano meter scale, type of Scanning Probe Microscopy. A stylus or probe is moved across a solid surface following the contours of the topography and provides a three dimensional image of the surface. https://simple.wikipedia.org/wiki/Atomic_force_microscopeLatest Status Log EntryMar 14, 2024 - User Report: Software has given "runtime error" a few times now. Restarting the computer seems to clear it. If you encounter it, try restarting the computer and make sure to leave a note whne you log out. Thanks! |
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