SPM/AFM Dimension 3100 - Status: Available
||Scanning Probe Microscope/ Atomic Force Microscope
AFM is a high resolution, nano meter scale, type of Scanning Probe Microscopy.
A stylus or probe is moved across a solid surface following the contours of the
topography and provides a three dimensional image of the surface.Latest Status Log EntryOct 3, 2022 - Resource Status Up - Up from Hurricane Ian shutdown.
|Training Topic||Description||Rates||Approx Session Length (hrs)|
|Dimension 3100 SPM/AFM Training||Standard Rate: $51.00/Complete User Training||N/A|
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