TEM - Aberration Corrected S/TEM JEM-ARM200cF (NHMFL - FSU) - Status: Down

Scanning/Transmission Electron Microscope (S/TEM)incorporating a probe spherical aberration (Cs) corrector for the electron optic system allowing resolution of 0.078 nm. (sub-Angstrom).
ONLY SERVICE REQUESTS CAN BE PLACED FOR THIS INSTRUMENT.
SEE ANNOUNCEMENT UNDER DOCS LINK BELOW. Latest Status Log EntryOct 6, 2016 - Resource Status Down - Down

Atomic-resolution HAADF-STEM
Resolution = 0.78 Angstroms

Atomic-resolution ABF-STEM
Resolution = 1.1 Angstroms

Electron Energy Loss Spectroscopy
(EELS) energy field of view = 2000 eV
Resolution = 0.25 eV

Spectrum Imaging
Resolution = 1.1 Angstroms