TEM - Aberration Corrected S/TEM JEM-ARM200cF (NHMFL - FSU) - Status: No Longer Available

 Scanning/transmission electron microscope (S/TEM) incorporating a probe spherical aberration (Cs) corrector for the electron optic system allowing resolution of 0.078 nm (sub Angstrom) in scanning mode.

PLEASE NOTE: only service requests may be submitted for this instrument; if you are interested in being trained to operate this instrument yourself, you should contact the staff at FSU directly.
Latest Status Log EntryOct 1, 2017 - Resource Status Up - Not sure why this was marked down.
Capabilities Training Prerequisites Calendar Contacts Docs
Contact LevelNameEmail
1Rudawski, Nicholasngr@ufl.edu
2Dempere, Luisa Ameliaademp@eng.ufl.edu

General Contact: rscinfo@mail.ufl.edu

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