TEM - JEOL 2010F S/TEM - Status: No Longer Available
  • Current Status: No Longer Available
  • Training: View Topics/Sessions
  • Use Rates:
    • External Academic & Government: $105.00/Hour
    • External Affiliated Commercial/Industrial: $187.50/Hour
    • External Commercial/Industrial: $250.00/Hour
    • External International Academic: $140.00/Hour
    • Internal Standard: $70.00/Hour
  • Service: Request Service Quote. The Staff rate is $50/hour
  • Building: MAEC (0183)
  • Room: Lab (112)
  • In Cleanroom: No
  • Main Contact: Nicholas Rudawski
 Field emission scanning/transmission electron microscope

PLEASE NOTE:
General access to this instrument is scheduled to end on January 1, 2018 and thus training is not available; users wishing to receive TEM training need to request training on the FEI Tecnai F20 S/TEM.Latest Status Log EntryJan 2, 2018 - Resource Status Up - Working as expected, but A/C not working in room; PPD notified
Capabilities Training Prerequisites Calendar Contacts Docs

100 - 200 kV operating voltage with Schottky field emission gun ZrO/W source; analytical objective lens pole piece (Cs = 1.0 mm at 200 kV); single- and double-tilt holders available; 0.32 nm point-to-point resolution in conventional TEM imaging; 0.23 nm Scherzer resolution in HR-TEM imaging; 0.15 nm resolution in high-angle annular dark-field scanning TEM imaging; digital imaging via bottom-mounted Gatan Orius SC200B camera; Oxford INCA Si(Li) energy dispersive spectroscopy system for detection of X-rays.

Available JEOL 2010F Consumables: CD-R

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