TEM - JEOL 2010F S/TEM - Status: Available
||Field emission scanning/transmission electron microscope
General access to this instrument is scheduled to end on January 1, 2018 and thus training is not available; users wishing to receive TEM training need to request training on the FEI Tecnai F20 S/TEM.Latest Status Log EntryOct 25, 2017 - Resource Status Up - gross misalignment fixed
100 - 200 kV operating voltage with Schottky field emission gun ZrO/W source; analytical objective lens pole piece (Cs = 1.0 mm at 200 kV); single- and double-tilt holders available; 0.32 nm point-to-point resolution in conventional TEM imaging; 0.23 nm Scherzer resolution in HR-TEM imaging; 0.15 nm resolution in high-angle annular dark-field scanning TEM imaging; digital imaging via bottom-mounted Gatan Orius SC200B camera; Oxford INCA Si(Li) energy dispersive spectroscopy system for detection of X-rays.
Available JEOL 2010F Consumables: CD-R, TEM Grids