TEM - JEOL 2010F S/TEM - Status: No Longer Available
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Field emission scanning/transmission electron microscope PLEASE NOTE: General access to this instrument is scheduled to end on January 1, 2018 and thus training is not available; users wishing to receive TEM training need to request training on the FEI Tecnai F20 S/TEM.Latest Status Log EntryJan 2, 2018 - Resource Status Up - Working as expected, but A/C not working in room; PPD notified |
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Acquiring SAED Patterns | Download |
Coating Form | Download |
Driver's Test | Download |
Equipment Image | Download |
JEOL 2010 EDS SOP | Download |
JEOL 2010 Standard Operating Procedure (SOP) | Download |
JEOL 2010 STEM SOP | Download |
Operating in DF mode | Download |
Polycrystalline DP acquisition | Download |
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