JEOL Superprobe 733 - Status: No Longer Available
||Electron Probe MicroAnalysis (EPMA):
is an analytical tool used to determine the chemical composition of small volumes of solid materials.
The sample is bombarded with an electron beam, emitting x-rays at wavelengths characteristic to the elements being analyzed.
This enables the assessment of the amount of elements present within small sample volumes (typically 10-30 μm3).
Qualify as an independent user of the SEM 6400. Latest Status Log EntryFeb 13, 2018 - Resource Status Down - down
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