Staff
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Bohorquez, Ana Postdoctoral Associate POB 116131 Ph: (352) 273-2207 ana.bohorquez@ufl.edu |
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Dale, Donald Administrative Support AST II 105 NRF, POB 116621 Ph: (352) 273-2203 ddale@ufl.edu |
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Dempere, Luisa Amelia Engineer, RSC Director POB 116400 Ph: (352) 846-2200 ademp@eng.ufl.edu Show Bio | Interests & Expertise |
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| Bio: Luisa Amelia Dempere received her Ph.D. in Materials Science from the University of Florida. After receiving her doctorate, she was appointed as the Director of the Major Analytical Instrumentation Center (MAIC). She has been the director of MAIC for the last 14 years, and in 2012 she became also the director of the Particle Analysis Instrumentation Center (PAIC). She is an Engineer faculty in the department of Materials Science and Engineering, and an Affiliated faculty in the department of Environmental Engineering Sciences. | |
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Gapinski, Scott ENGINEER SUPERVISOR POB 116500 Ph: (352) 392-7878 gap@nimet.ufl.edu |
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Gila, Brent RES AST SCIENTIST POB 116621 Ph: (352) 273-2245, Fax: (352) 846-2877 bgila@ufl.edu |
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Hays, David Engineering Technician & Scientist 104 NRF, POB 116621 Ph: (352) 273-2286 dhays@nimet.ufl.edu Hide Bio |
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| Bio: David Hays is a staff scientist/engineer and is responsible for maintaining, operating and training users on all of the tools at the NRF. He specifically oversees the plasma etching and metrology tools. He holds a BS and MS in materials science from the University of Florida and studied under Dr. Stephen Pearton. Prior to joining the NRF, he spent many years in industry at Sony Semiconductor and GE Global Research as a process and device development engineer in the fields of MEMS and nanotechnology. Within these fields, he has published numerous papers in various journals and holds many patents as well. | |
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Lambers, Eric Assistant Engineer POB 116400 Ph: (352) 392-4630 elamb@ufl.edu Show Bio |
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| Bio: Eric Lambers learned Ultra High Vacuum (UHV) surface analysis working with Paul Holloway starting in 1983. In 1986 he joined the MAIC staff and his main expertise is Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS) equipment. | |
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Lewis, Bill Engineering Technician & Scientist 104 NRF, POB 116621 Ph: (352) 273-2285 walewis@ufl.edu Show Bio |
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| Bio: Bill Lewis is a staff scientist/engineer and is responsible for maintaining, operating and training users on all of the tools at the NRF. His specific area of expertise is photolithography and metrology and has been a part of the NRF since 2003. Prior to joining the NRF, Bill spent 20 years in the semiconductor industry working for Texas Instruments, Intel Corp. and Agere Systems. His rolls ranged from process and maintenance support of photolithography equipment to defect reduction. | |
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Norton, Greg Systems Admin/Programmer 206 NRF, POB 116621 Ph: (352) 846-1712, Fax: (352) 392-0390 gnorton@ufl.edu |
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Ogden, Al ENGINEER POB 116621 Ph: (352) 273-2287 alogden@ufl.edu Show Bio |
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| Bio: Al Ogden is a staff scientist/engineer and is responsible for maintaining, operating and training users on all of the tools at the NRF. His experience covers nearly all aspects of micro fabrication with his specialty in back end processing. Al became a member of the staff of the Photonics Research Lab in ECE in 1990. In 1997-98 Al held a joint position with UF and UC Davis working for the Compact Muon Solenoid project in high energy physics. In 1999 Al became the managing engineer of the Microelectronics Lab in ECE and was then merged with the NRF. He was a member of the US Army and attended the Augusta State Collage, the University of Texas at San Antonio, and the University of Florida. | |
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Rudawski, Nicholas Associate Engineer POB 116400 Ph: 352-392-3077 ngr@ufl.edu Show Bio |
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| Bio: Nicholas G. Rudawski received his B.S.E. degree in Materials Science and Engineering from the University of Michigan in 2005 while researching growth and characterization of III-V semiconductors and completed his Ph.D. degree in Materials Science and Engineering from the University of Florida in 2008 studying structure-processing-property relationships in ion-implanted Si. He completed additional post-doctoral training at the University of California at Santa Barbara in transmission electron microscopy of complex oxides and semiconductors and at the University of Florida in electrochemical studies of elemental semiconductors for Li ion battery applications before joining the RSC in August of 2012, where he began overseeing the transmission electron microscopes and the dual beam scanning electron microscope/focused ion beam. His background is primarily in materials characterization using transmission electron microscopy with emphasis on the use and development of focused ion beam-based techniques for specimen preparation. Starting in April of 2016, he also began overseeing operation of the new Tescan scanning electron microscope equipped with energy dispersive spectroscopy and electron backscattered diffraction. He has authored or coauthored nearly 40 peer-reviewed publications in journals such as Physical Review Letters, Materials Science and Engineering R: Reports, Applied Physics Letters, and Journal of Power Sources and contributed ~30 conference presentations since 2003. His current CV is available upon request. | |
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Scheiffele, Gary Engineer III 203 NRF, POB 116621 Ph: (352) 846-1733 gscheiffele@eng.ufl.edu Show Bio | Interests & Expertise |
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| Bio: Gary Scheiffele worked in the Materials Science Department in ceramics processing from 1983-1998 and then joined the Particle Engineering Research Center, the auxiliary side of which became PAIC in 2012. His expertise is in analysis of particles and particle systems, including IR and Raman spectroscopy, pore characterization, rheology, particle size and zeta potential analysis as well as X-ray computed tomography (CT). | |
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Schepker, Kristy POB 116621 Ph: (352) 373-2252 kschepker@ufl.edu |
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Trucco, Andres Engineering Technician & Scientist 104 NRF, POB 116621 Ph: (352) 294-7517 andres5@ufl.edu Show Bio |
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| Bio: Andres Trucco is the newest staff scientist/engineer and is responsible for maintaining, operating and training users on many of the tools at the NRF. | |
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Walker, Bruce Office Assistant NRF, POB 116621 Ph: (352) 846-2626 bwalker2@ufl.edu |
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