Panalytical XPert MRD - Status: In Use
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X-ray crystallography is a technique in crystallography in which the pattern produced by the diffraction of x-rays through the closely spaced lattice of atoms in a crystal is recorded and then analyzed to reveal the nature of that lattice. Latest Status Log EntryJan 4, 2021 - Resource Status Up - Up from holiday break |
Materials Research Diffractometer (MRD):
system available for X-ray diffraction studies for:
- advanced materials science and nanotechnology
- metrologic characterization in semiconductor process development
It can handle a wide range of applications, and is especially suitable for thin film analysis applications such as:
- rocking curve analysis and reciprocal space mapping
- reflectometry and thin film phase analysis
- residual stress and texture analysis
Tube Anode type: Cu
Tube Power: 1800W
Goniometer Type: Four circle
Range: variable (based on scan axis and configuration)
Minimum step size: 0.01 – 0.0001 degrees (axis dependent)
Sample size, LOD, etc. are sample dependent.
Sample holder type: flat stage (motorized)