Panalytical XPert MRD - Status: In Use
  • Current Status: In Use
  • Training: View Topics/Sessions
  • Use Rates:
    • External Academic & Government: $37.50/Hour
    • External Affiliated Commercial/Industrial: $150.00/Hour
    • External Commercial/Industrial: $200.00/Hour
    • External International Academic: $50.00/Hour
    • Internal Standard: $25.00/Hour
  • Service: Request Service Quote. The Staff rate is $50/hour
  • Building: NANO (0070)
  • Room: X-Ray Diffraction Lab (233)
  • Room Max Occupancy: 4
  • In Cleanroom: No
  • Main Contact: Kristy Schepker
 X-ray crystallography is a technique in crystallography in which the pattern produced by the diffraction of x-rays through the closely spaced lattice of atoms in a crystal is recorded and then analyzed to reveal the nature of that lattice. Latest Status Log EntryApr 2, 2021 - Resource Status Up - Issues seem isolated to detector 1, please only use detector 2 at this time.
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Materials Research Diffractometer (MRD): system available for X-ray diffraction studies for:
- advanced materials science and nanotechnology
- metrologic characterization in semiconductor process development
It can handle a wide range of applications, and is especially suitable for thin film analysis applications such as:
- rocking curve analysis and reciprocal space mapping
- reflectometry and thin film phase analysis
- residual stress and texture analysis

Tube Anode type: Cu
Tube Power: 1800W
Goniometer Type: Four circle
Range: variable (based on scan axis and configuration)
Minimum step size: 0.01 – 0.0001 degrees (axis dependent)
Sample size, LOD, etc. are sample dependent.
Sample holder type: flat stage (motorized)