Panalytical XPert MRD - Status: Down
  • Current Status: Down
  • Use Rates:
    • External Academic & Government: $75.00/Hour
    • External Affiliated Commercial/Industrial: $150.00/Hour
    • External Commercial/Industrial: $200.00/Hour
    • External International Academic: $100.00/Hour
    • Internal Standard: $50.00/Hour
  • Service: Request Service Quote. The Staff rate is $50/hour
  • Building: NANO (0070)
  • Room: General Lab 6 (233)
  • In Cleanroom: No
  • Main Contact: rscinfo@mail.ufl.edu
 X-ray crystallography is a technique in crystallography in which the pattern produced by the diffraction of x-rays through the closely spaced lattice of atoms in a crystal is recorded and then analyzed to reveal the nature of that lattice. Latest Status Log EntryMay 22, 2018 - Resource Status Down - System is down for move to the NRF building.
Capabilities Training Prerequisites Calendar Contacts Docs

Materials Research Diffractometer (MRD): system available for X-ray diffraction studies for:
- advanced materials science and nanotechnology
- metrologic characterization in semiconductor process development
It can handle a wide range of applications, and is especially suitable for thin film analysis applications such as:
- rocking curve analysis and reciprocal space mapping
- reflectometry and thin film phase analysis
- residual stress and texture analysis

Tube Anode type: Cu
Tube Power: 1800W
Goniometer Type: Four circle
Range: variable (based on scan axis and configuration)
Minimum step size: 0.01 – 0.0001 degrees (axis dependent)
Sample size, LOD, etc. are sample dependent.
Sample holder type: flat stage (motorized)

Available XPert MRD Consumables: CD-R, Glass Slides, XRD Sample Holders