Staff

Dale, Donald
Administrative Support AST II
105 NRF, POB 116621
Ph: (352) 273-2203
ddale@ufl.edu
Dempere, Luisa Amelia
Engineer, RSC Director
POB 116400
Ph: (352) 846-2200
ademp@eng.ufl.edu
Show Bio | Interests & Expertise
Bio: Luisa Amelia Dempere received her Ph.D. in Materials Science from the University of Florida. After receiving her doctorate, she was appointed as the Director of the Major Analytical Instrumentation Center (MAIC). She has been the director of MAIC for the last 14 years, and in 2012 she became also the director of the Particle Analysis Instrumentation Center (PAIC). She is an Engineer faculty in the department of Materials Science and Engineering, and an Affiliated faculty in the department of Environmental Engineering Sciences.
Fitch, Makayla
Office Assistant
POB 116400
Ph: (352) 846-2626
m.fitch@ufl.edu
Gapinski, Scott
ENGINEER SUPERVISOR
POB 116500
Ph: (352) 392-7878
gap@nimet.ufl.edu
Gila, Brent
Associate Director
POB 116621
Ph: (352) 273-2245, Fax: (352) 846-2877
bgila@ufl.edu
Hays, David
Engineering Technician & Scientist
104 NRF, POB 116621
Ph: (352) 273-2286
dhays@nimet.ufl.edu
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Bio: David Hays is a staff scientist/engineer and is responsible for maintaining, operating and training users on all of the tools at the NRF. He specifically oversees the plasma etching and metrology tools. He holds a BS and MS in materials science from the University of Florida and studied under Dr. Stephen Pearton. Prior to joining the NRF, he spent many years in industry at Sony Semiconductor and GE Global Research as a process and device development engineer in the fields of MEMS and nanotechnology. Within these fields, he has published numerous papers in various journals and holds many patents as well.
Lewis, Bill
Engineering Technician & Scientist
104 NRF, POB 116621
Ph: (352) 273-2285
walewis@ufl.edu
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Bio: Bill Lewis is a staff scientist/engineer and is responsible for maintaining, operating and training users on all of the tools at the NRF. His specific area of expertise is photolithography and metrology and has been a part of the NRF since 2003. Prior to joining the NRF, Bill spent 20 years in the semiconductor industry working for Texas Instruments, Intel Corp. and Agere Systems. His rolls ranged from process and maintenance support of photolithography equipment to defect reduction.
Norton, Greg
Systems Admin/Programmer
206 NRF, POB 116621
Ph: (352) 846-1712, Fax: (352) 392-0390
gnorton@ufl.edu
Ogden, Al
ENGINEER
POB 116621
Ph: (352) 273-2287
alogden@ufl.edu
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Bio: Al Ogden is a staff scientist/engineer and is responsible for maintaining, operating and training users on all of the tools at the NRF. His experience covers nearly all aspects of micro fabrication with his specialty in back end processing. Al became a member of the staff of the Photonics Research Lab in ECE in 1990. In 1997-98 Al held a joint position with UF and UC Davis working for the Compact Muon Solenoid project in high energy physics. In 1999 Al became the managing engineer of the Microelectronics Lab in ECE and was then merged with the NRF. He was a member of the US Army and attended the Augusta State Collage, the University of Texas at San Antonio, and the University of Florida.
Rudawski, Nicholas
Associate Engineer
POB 116400
Ph: 352-392-3077
ngr@ufl.edu
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Bio: Nicholas “Nick” G. Rudawski received his B.S.E. degree in Materials Science and Engineering from the University of Michigan in 2005 while researching growth and characterization of III-V semiconductors; he completed his Ph.D. degree in Materials Science and Engineering from the University of Florida in 2008 studying structure-processing-property relationships in ion-implanted Si. Subsequently, he completed post-doctoral training at the University of California at Santa Barbara in transmission electron microscopy of complex oxides and semiconductors before returning to the University of Florida for additional post-doctoral training in electrochemical studies of elemental semiconductors for Li ion battery applications. He joined the Research Service Centers in August of 2012, where he primarily oversees the transmission electron microscopes and dual beam scanning electron microscope/focused ion beams. He has authored/coauthored 50 peer-reviewed publications contributed over 30 conference presentations since 2003. His current CV is available upon request.
Scheiffele, Gary
Engineer III
203 NRF, POB 116621
Ph: (352) 846-1733
gscheiffele@eng.ufl.edu
Show Bio | Interests & Expertise
Bio: Gary Scheiffele worked in the Materials Science Department in ceramics processing from 1983-1998 and then joined the Particle Engineering Research Center, the auxiliary side of which became PAIC in 2012. His expertise is in analysis of particles and particle systems, including IR and Raman spectroscopy, pore characterization, rheology, particle size and zeta potential analysis as well as X-ray computed tomography (CT).
Schepker, Kristy

POB 116621
Ph: (352) 273-2252
kschepker@ufl.edu
Thiyagarajah, Meena
Associate Director of Administrative Services
231 MAE-A
Ph: (352) 392-4878
tmeena@ufl.edu
Trucco, Andres
Engineering Technician & Scientist
104 NRF, POB 116621
Ph: (352) 294-7517
andres5@ufl.edu
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Bio: Andres Trucco is the newest staff scientist/engineer and is responsible for maintaining, operating and training users on many of the tools at the NRF.