Staff

Carpinone, Paul
Staff Engineer
POB 116400
Ph: (352) 392-2437
pcarp@ufl.edu
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Bio: Paul Carpinone received his BS degree in Chemical Engineering and PhD in Materials Engineering. He was part of the Particle Engineering Research Center since 2006 and joined MAIC full time in the fall of 2013. He currently oversees the MAIC x-ray diffraction facilities and some of the characterization facilities in PAIC. His research interests include x-ray diffraction, surface and interfacial chemistry, and particle synthesis and characterization.
Dale, Donald
Administrative Support AST II
105 NRF, POB 116621
Ph: (352) 273-2203
ddale@ufl.edu
Dempere, Luisa Amelia
Engineer, RSC Director
POB 116400
Ph: (352) 846-2200
ademp@eng.ufl.edu
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Bio: Luisa Amelia Dempere received her Ph.D. in Materials Science from the University of Florida. After receiving her doctorate, she was appointed as the Director of the Major Analytical Instrumentation Center (MAIC). She has been the director of MAIC for the last 14 years, and in 2012 she became also the director of the Particle Analysis Instrumentation Center (PAIC). She is an Engineer faculty in the department of Materials Science and Engineering, and an Affiliated faculty in the department of Environmental Engineering Sciences.
Gapinski, Scott
ENGINEER SUPERVISOR
POB 116500
Ph: (352) 392-7878
gap@nimet.ufl.edu
Gila, Brent
RES AST SCIENTIST
POB 116621
Ph: (352) 273-2245, Fax: (352) 846-2877
bgila@ufl.edu
Hays, David
Engineering Technician & Scientist
104 NRF, POB 116621
Ph: (352) 273-2286
dhays@nimet.ufl.edu
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Bio: David Hays is a staff scientist/engineer and is responsible for maintaining, operating and training users on all of the tools at the NRF. He specifically oversees the plasma etching and metrology tools. He holds a BS and MS in materials science from the University of Florida and studied under Dr. Stephen Pearton. Prior to joining the NRF, he spent many years in industry at Sony Semiconductor and GE Global Research as a process and device development engineer in the fields of MEMS and nanotechnology. Within these fields, he has published numerous papers in various journals and holds many patents as well.
Lambers, Eric
Assistant Engineer
POB 116400
Ph: (352) 392-4630
elamb@ufl.edu
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Bio: Eric Lambers learned Ultra High Vacuum (UHV) surface analysis working with Paul Holloway starting in 1983. In 1986 he joined the MAIC staff and his main expertise is Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS) equipment.
Lewis, Bill
Engineering Technician & Scientist
104 NRF, POB 116621
Ph: (352) 273-2285
walewis@ufl.edu
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Bio: Bill Lewis is a staff scientist/engineer and is responsible for maintaining, operating and training users on all of the tools at the NRF. His specific area of expertise is photolithography and metrology and has been a part of the NRF since 2003. Prior to joining the NRF, Bill spent 20 years in the semiconductor industry working for Texas Instruments, Intel Corp. and Agere Systems. His rolls ranged from process and maintenance support of photolithography equipment to defect reduction.
Navarro velazquez, Kiwanie
Administration Assistant
POB 116400
Ph: (352) 392-6985
kiwanie.n94@ufl.edu
Norton, Greg
IT Professional II
206 NRF, POB 116621
Ph: (352) 846-1712, Fax: (352) 392-0390
gnorton@ufl.edu
Ogden, Al
ENGINEER
POB 116621
Ph: (352) 273-2287
alogden@ufl.edu
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Bio: Al Ogden is a staff scientist/engineer and is responsible for maintaining, operating and training users on all of the tools at the NRF. His experience covers nearly all aspects of micro fabrication with his specialty in back end processing. Al became a member of the staff of the Photonics Research Lab in ECE in 1990. In 1997-98 Al held a joint position with UF and UC Davis working for the Compact Muon Solenoid project in high energy physics. In 1999 Al became the managing engineer of the Microelectronics Lab in ECE and was then merged with the NRF. He was a member of the US Army and attended the Augusta State Collage, the University of Texas at San Antonio, and the University of Florida.
Rudawski, Nicholas
Assistant Engineer
POB 116400
Ph: 352-392-3077
ngr@ufl.edu
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Bio: Nicholas G. Rudawski received his B.S.E. degree in Materials Science and Engineering from the University of Michigan in 2005 while researching growth and characterization of III-V semiconductors and completed his Ph.D. degree in Materials Science and Engineering from the University of Florida in 2008 studying structure-processing-property relationships in ion-implanted Si. He completed additional post-doctoral training at the University of California at Santa Barbara in transmission electron microscopy of complex oxides and semiconductors and at the University of Florida in electrochemical studies of elemental semiconductors for Li ion battery applications before joining the RSC in August of 2012, where he began overseeing the transmission electron microscopes and the dual beam scanning electron microscope/focused ion beam. His background is primarily in materials characterization using transmission electron microscopy with emphasis on the use and development of focused ion beam-based techniques for specimen preparation. Starting in April of 2016, he also began overseeing operation of the new Tescan scanning electron microscope equipped with energy dispersive spectroscopy and electron backscattered diffraction. He has authored or coauthored nearly 40 peer-reviewed publications in journals such as Physical Review Letters, Materials Science and Engineering R: Reports, Applied Physics Letters, and Journal of Power Sources and contributed ~30 conference presentations since 2003. His current CV is available upon request.
Scheiffele, Gary
PAIC Manager
9 Annex, POB 116135
Ph: (352) 846-1733, Fax: (352) 846-1196
gscheiffele@perc.ufl.edu
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Bio: Gary Scheiffele worked in the Materials Science Department in ceramics processing from 1983-1998 and then joined the Particle Engineering Research Center, the auxiliary side of which became PAIC in 2012. His expertise is in analysis of particles and particle systems, including IR and Raman spectroscopy, pore characterization, rheology, particle size and zeta potential analysis.
Trucco, Andres
Engineering Technician & Scientist
104 NRF, POB 116621
Ph: (352) 294-7517
andres5@ufl.edu
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Bio: Andres Trucco is the newest staff scientist/engineer and is responsible for maintaining, operating and training users on many of the tools at the NRF.