SEM - JEOL 5700 - Status: Available
||The JEOL 5700 utilizes a standard tungsten filament and is capable of imaging from 8X to 300,000X and up to 5nm resolution.
Scanning Electron Microscopy wiki link
Latest Status Log EntryJan 25, 2023 - Resource Status Up - new computer installed and tool is back up for use
|Computer Access||Requires computer access be setup||Check Your Status|
|Funding Source||Requires permission to an active funding source||Check Your Status|
|Work Plan||Requires a work plan be approved by PI and staff||Check Your Status|
|Agreement Form||Requires completed agreement form for equipment usage||Check Your Status|
|RSC Safety Training||Requires completion of safety training||Check Your Status|
|NRF Building Access||Requires issue of an id badge and entry badge and/or access level to be set.||Check Your Status|
|Equipment Training||Requires completion of equipment training||Check Your Status|
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