4 Point Probe Station - Status: Available

  • Current Status: Available
  • Use Rates:
    • External Academic & Government: $0.00/Hour
    • External Affiliated Commercial/Industrial: $0.00/Hour
    • External Commercial/Industrial: $0.00/Hour
    • External International Academic: $0.00/Hour
    • Internal Standard: $0.00/Hour
  • Service: Request Service Quote. The Staff rate is $50/hour
  • Building: NANO (0070)
  • Room: Microscopy Sample Prep (125)
  • In Cleanroom: No
  • Main Contact: rscinfo@mail.ufl.edu
The VEECO FPP-5000 4-point probe simplifies the measurement of resistive properties of semiconductor wafers and resistive films. The microprocessor based electronics permits direct computation of V/I, sheet or slice resistivity, and metallization thickness and P-N type testing. Unlike most four point probes and probing stations, which move the probe head into the wafer, the FPP-5000 is designed so that the wafer is moved into the probe head. This insures constant probe force independent of operator force and wafer thickness.

4 pt probe wiki linkLatest Status Log EntrySep 13, 2017 - Resource Status Up - restart after storm

The VEECO FPP-5000 4-point probe simplifies the measurement of resistive properties of semiconductor wafers and resistive films. The microprocessor based electronics permits direct computation of V/I, sheet or slice resistivity, and metallization thickness and P-N type testing. Unlike most four point probes and probing stations, which move the probe head into the wafer, the FPP-5000 is designed so that the wafer is moved into the probe head. This insures constant probe force independent of operator force and wafer thickness.

There is no cost for training on this instrument but a brief familiarization is required and provided by staff as needed.

Requirements before use
1. To sign up for training go on the NRF website.
2. Check-out platen, wafer holder, and hand held probe at the reception desk.