SEM - Tescan MIRA3 - Status: Available
||The Tescan MIRA3 scanning electron microscope rasters a focused energetic beam (probe) of electrons across a specimen surface. The interactions of the beam with the specimen are detected and then recorded as a function of probe position and used to generate two-dimensional images of the specimen. The signals that can be detected include secondary and backscattered electrons (for imaging), X-rays (for chemical analysis), and electron backscattered diffraction patterns (for structural analysis).
Latest Status Log EntryMar 20, 2020 - User Note: Replaced key board. Nick installed new trackball. Seems to be working OK now. Bad keyboard?
0.2 - 30 keV operating voltage with Schottky field emission gun ZrO/W source; EDAX Octane Pro energy dispersive spectroscopy (EDS) system for detection of X-rays; EDAX Hikari Plus camera for collection of electron backscattered diffraction (EBSD) patterns; EDAX TEAM software for collection and analysis of EDS and EBSD data (either individually or simultaneously); EDAX OIM Analysis 8 software for analysis of EBSD data.