SEM - Tescan MIRA3 - Status: Available
||*ANALYSIS OF RADIOACTIVE SPECIMENS WITH THIS INSTRUMENT IS STRICTLY PROHIBITED*
The Tescan MIRA3 scanning electron microscope rasters a focused energetic beam (probe) of electrons across a specimen surface. The interactions of the beam with the specimen are detected and then recorded as a function of probe position and used to generate two-dimensional images of the specimen. The signals that can be detected include secondary and backscattered electrons (for imaging), X-rays (for chemical analysis), and electron backscattered diffraction patterns (for structural analysis).
TRAINING REQUIREMENTS: Course EMA 6507 or Discussing with staff the content of the following reading material: Goldstein, J.I., Newbury, D.E., Echlin. P., Joy, D.C., Romig, A.D. Jr., Lyman, C.E., Fiori,C., and Lifshin, E. Scanning Electron Microscopy and X-Ray Microanalysis, A Text for Biologists, Materials Scientists, and Geologists. Third Edition. 2003. ISBN 0-306-47292-9 Chapters 2, 3 and 5. You will be directed to a quiz sign up link when requesting training for any of the SEM's. Latest Status Log EntryJun 2, 2023 - User Note: PM done by AJ. Mechanical pump tip seals replaced. Software updates. Column alignments.
|Computer Access||Requires computer access be setup||Check Your Status|
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|SEM Competency||Requires completion of SEM Competency Quiz||Check Your Status|
|Work Plan||Requires a work plan be approved by PI and staff||Check Your Status|
|Agreement Form||Requires completed agreement form for equipment usage||Check Your Status|
|RSC Safety Training||Requires completion of safety training||Check Your Status|
|NRF Building Access||Requires issue of an id badge and entry badge and/or access level to be set.||Check Your Status|
|Equipment Training||Requires completion of equipment training||Check Your Status|
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