TEM - FEI Tecnai F20 S/TEM - Status: Available
||20 - 200 kV operating voltage with Schottky field emission gun ZrO/W source; super-twin objective lens pole (Cs = 1.2 mm at 200 kV); single- and double-tilt holders available; 0.34 nm point-to-point resolution in conventional TEM imaging; 0.24 nm Scherzer resolution in HR-TEM imaging; 0.16 nm resolution in high-angle annular dark-field scanning TEM imaging; Fischione Instruments Model 3000 STEM detector; digital imaging via bottom-mounted Gatan UltraScan 1000P camera; EDAX r-TEM super ultra-thin window Si(Li) energy dispersive spectroscopy system for detection of X-rays.
1. You must first create an RSC user account.
2. You must then complete RSC safety training.
3. You must complete or be enrolled in EMA 6518 OR discuss with staff all material relevant to your intended scope of work outlined in the “TEM competency assessment” document listed under the “Docs” page. If you do not already have authorization via completion of or enrollment in EMA 6518, you will be directed to a quiz sign up link when requesting training.
PLEASE NOTE: due to the time and cost associated with being trained on this instrument, if you only have a few specimens needing analysis, we strongly recommend you request service, rather than training. Latest Status Log EntryMay 1, 2018 - Resource Status Up - objective apertures cleaned and functioning properly again