TEM - FEI Talos F200i S/TEM - Status: Down

  • Current Status: Down
  • Training: View Topics/Sessions
  • Use Rates:
    • External Academic & Government: $105.00/Hour
    • External Affiliated Commercial/Industrial: $187.50/Hour
    • External Commercial/Industrial: $250.00/Hour
    • External International Academic: $140.00/Hour
    • Internal Standard: $50.00/Hour
  • Building: NANO (0070)
  • Room: FIB Room (136)
  • Room Max Occupancy: 3
  • In Cleanroom: No
  • Main Contact: Nicholas Rudawski

The FEI Talos F200i S/TEM is a state-of-the-art field emission gun scanning/transmission electron microscope capable of providing micro- to atomic-scale structural, morphological, and chemical information.

Instrument Specifications:

  • Configured for 80 or 200 kV operation
  • X-twin objective lens (Cs = 1.2 mm at 200 kV) with single-, and double-tilt (hex ring) holders available
  • Bottom-mounted FEI Ceta 16 megapixel CMOS camera; Fischione Instruments Model 3000 HAADF-STEM detector; FEI BF/DF STEM detectors; DPC imaging capable
  • 0.34 nm point-to-point resolution in conventional TEM imaging (at 200 kV); 0.24 nm Scherzer resolution in HR-TEM imaging (at 200 kV); 136 pm STEM resolution (at 200 kV)
  • Bruker XFlash 6T|30 windowless silicon drift detector (30 square mm detector area) energy dispersive spectroscopy system

  • YouTube video playlist (tutorials, concepts, and fundamentals related to TEM)

    YouTube video demonstrating basic conventional (static beam) mode operation of the Talos

    YouTube video demonstrating STEM mode operation of the Talos

    YouTube video demonstrating spatially-resolved EDS using the Talos in STEM mode

    YouTube video demonstrating collection of selected area diffraction patterns using the Ceta camera

    Zoom workshop on atomic-resolution STEM (recorded 04/14/21)


    1. You must create an RSC user account with a PI-approved funding source.

    2. You must complete RSC general safety training.

    3. If you are NOT already a user of the FEI Tecnai F20 S/TEM, you must complete the TEM Knowledge Training course through eLearning; submit a training request using the "Training" link at the bottom of the page and follow the instructions to be added to the course; you must complete this course regardless of any prior coursework or operational experience related to TEM you may have.

    Latest Status Log EntryNov 8, 2021 - User Note: Service call opened

  • Bright-field, centered/weak-beam/conical dark-field, and high-resolution (lattice) conventional mode (static beam) imaging
  • Atomic-resolution HAADF, LAADF, BF, ADF, ABF, and DPC STEM imaging
  • ~1 nm resolution energy dispersive spectroscopy (elemental mapping)