TEM - FEI Talos F200i S/TEM - Status: Available

  • Current Status: Available
  • Use Rates:
    • External Academic & Government: $105.00/Hour
    • External Affiliated Commercial/Industrial: $187.50/Hour
    • External Commercial/Industrial: $250.00/Hour
    • External International Academic: $140.00/Hour
    • Internal Standard: $50.00/Hour
  • Building: NANO (0070)
  • Room: FIB Room (136)
  • In Cleanroom: No
  • Main Contact: rscinfo@mail.ufl.edu
The FEI Talos F200i S/TEM is a state-of-the-art field emission gun scanning/transmission electron microscope capable of providing micro- to atomic-scale structural, morphological, and chemical information.

20 - 200 kV operating voltage with Schottky field emission gun ZrO/W source (currently configured for operation at 80 and 200 kV); X-twin objective lens pole piece (Cs = 1.2 mm at 200 kV); single- and double-tilt (hex ring) holders available; 0.34 nm point-to-point resolution in conventional TEM imaging (at 200 kV); 0.24 nm Scherzer resolution in HR-TEM imaging (at 200 kV); 0.14 nm resolution in high-angle annular dark-field scanning TEM imaging (at 200 kV); Fischione Instruments Model 3000 STEM detector; digital imaging via bottom-mounted FEI Ceta 16 megapixel camera; Bruker XFlash 6T|30 windowless silicon drift detector (30 square mm detector area) energy dispersive spectroscopy system for chemical analysis via detection of X-rays.

YouTube videos demonstrating instrument operation and other TEM concepts

TRAINING REQUIREMENTS:

1. You must create an RSC user account with a PI-approved funding source.

2. You must complete RSC general safety training.

3. If you are NOT already a user of the FEI Tecnai F20 S/TEM, you must complete the TEM Knowledge Training course through eLearning; submit a training request using the "Training" link at the bottom of the page and follow the instructions to be added to the course; you must complete this course regardless of any prior coursework or operational experience related to TEM you may have.

Latest Status Log EntryFeb 12, 2020 - Resource Status Up - please report any issues

Conventional (static beam) TEM imaging: bright-field, centered/weak-beam/conical dark-field, and high-resolution (lattice) imaging

Scanning TEM imaging: high/low-angle annular-dark-field, annular bright-field, and bright-field imaging

Energy dispersive spectroscopy: elemental analysis (points, linescans, and maps) with spatial resolution of ~1 nm