SEM - FEI Nova 430 w/EDS & CL - Status: Down
||The FEI Nova NanoSEM 430 is a FE SEM with resolution below 1 nm. The tool has an EDS detector and a monochromatic CL detector included.
Scanning Electron Microscopy wiki link
Guide to SEM Observation
Energy-Dispersive x-ray Spectroscopy (EDS) wiki link
Cathodoluminescence wiki link
TRAINING REQUIREMENTS: Course EMA 6507 or Discussing with staff the content of the following reading material: Goldstein, J.I., Newbury, D.E., Echlin. P., Joy, D.C., Romig, A.D. Jr., Lyman, C.E., Fiori,C., and Lifshin, E. Scanning Electron Microscopy and X-Ray Microanalysis, A Text for Biologists, Materials Scientists, and Geologists. Third Edition. 2003. ISBN 0-306-47292-9 Chapters 2, 3 and 5.
You will be directed to a quiz sign up link when requesting training for any of the SEM's.
Latest Status Log EntryNov 30, 2023 - User Note: Service engineer has been working on the instrument. Replaced most of the column, aperture strip among other parts. Instrument still down. Replaced upper column has a leak and new column has been ordered. Waiting on ThermoFisher for delivery time.
The FEI Nova NanoSEM 430 is a state-of-the-art SEM that utilized a field emission electron source and immersion lens technology to obtain resolution below 1 nm. The NanoSEM is capable of imaging from 8X to 300,000X, working distance permitting. Accelerating voltage can be varied from 50V (with beam deceleration) to 30kV. It features a motorized XYZ stage with full 360° rotation and -10° to 90° tilt and can hold a full 4” wafer.
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