SEM - FEI Nova 430 w/EDS & CL - Status: Available
  • Current Status: Available
  • Training: View Topics/Sessions
  • Use Rates:
    • External Academic & Government: $93.00/Hour
    • External Affiliated Commercial/Industrial: $157.50/Hour
    • External Commercial/Industrial: $210.00/Hour
    • External International Academic: $124.00/Hour
    • Internal Standard: $62.00/Hour
  • Service: Request Service Quote. The Staff rate is $50/hour (Internal) and $55 /hour (External) in addition to the instrument rate.
  • Building: NANO (0070)
  • Room: FE Sem (134)
  • In Cleanroom: No
  • Main Contact: Andres Trucco
 The FEI Nova NanoSEM 430 is a FE SEM with resolution below 1 nm. The tool has an EDS detector and a monochromatic CL detector included.

Scanning Electron Microscopy wiki link
Guide to SEM Observation
Energy-Dispersive x-ray Spectroscopy (EDS) wiki link
Cathodoluminescence wiki link

TRAINING REQUIREMENTS: Course EMA 6507 or Discussing with staff the content of the following reading material: Goldstein, J.I., Newbury, D.E., Echlin. P., Joy, D.C., Romig, A.D. Jr., Lyman, C.E., Fiori,C., and Lifshin, E. Scanning Electron Microscopy and X-Ray Microanalysis, A Text for Biologists, Materials Scientists, and Geologists. Third Edition. 2003. ISBN 0-306-47292-9 Chapters 2, 3 and 5.
You will be directed to a quiz sign up link when requesting training for any of the SEM's.
Latest Status Log EntryFeb 1, 2024 - User Note: New Ion pum controller installed. New one has battery back up. Work done by Derek.
Capabilities Training Prerequisites Calendar Contacts Docs
Contact LevelNameEmail
1Trucco, Andresandres5@ufl.edu
2Trachet, Alisonaat425@ufl.edu
3Hays, Daviddhays@nimet.ufl.edu
4Gila, Brentbgila@ufl.edu

General Contact: rscinfo@mail.ufl.edu

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