FIB - FEI Helios NanoLab 600 dual beam FIB/SEM - Status: Available
  • Current Status: Available
  • Training: View Topics/Sessions
  • Use Rates:
    • External Academic & Government: $97.50/Hour
    • External Affiliated Commercial/Industrial: $187.50/Hour
    • External Commercial/Industrial: $250.00/Hour
    • External International Academic: $130.00/Hour
    • Internal Standard: $65.00/Hour
  • Service: Request Service Quote. The Staff rate is $50/hour
  • Building: NRB (0557)
  • Room: Room (8B)
  • Room Max Occupancy: 1
  • In Cleanroom: No
  • Main Contact: Nicholas Rudawski
 The FEI Helios NanoLab 600 DualBeam system integrates focused ion and scanning electron beams for FIB and SEM functionality in one instrument.

Instrument Specifications:

  • Schottky field emission gun Elstar SEM column; 0.3 - 30 kV operating voltage with <0.1 nm resolution
  • Ga liquid metal FIB source
  • Sidewinder FIB column with 2 - 30 kV operating voltage
  • In-situ Pt deposition
  • Omniprobe AutoProbe 200 in-situ micromanipulator
  • EDAX Octane Elite (70 mm squared active area) SDD EDS
  • EDAX Velocity EBSD camera

    • YouTube video demonstrating what is covered in basic training of the Helios

    YouTube video tutorial on use of the Helios to prepare lamellas

    TRAINING REQUIREMENTS:

    1. You must create an RSC user account with a PI-approved funding source.

    2. You must complete RSC general safety training.

    3. You must complete the Radiation Safety Short Course AND obtain a dosimeter badge (regardless if you are working with radioactive or non-radioactive materials).

    4. You must complete the FIB Knowledge Training course through eLearning; submit a training request using the "Training" link at the bottom of the page and follow the instructions to be added to the course; you must complete this course regardless of any prior coursework or operational experience related to SEM or FIB you may have.

    Latest Status Log EntryMay 12, 2021 - Resource Status Up - OMNIPROBE STILL NOT WORKING but system otherwise fully operational
    Capabilities Training Prerequisites Calendar Contacts Docs

  • High-quality TEM lamella preparation via in-situ liftouts
  • High-resolution electron beam imaging of FIB cross sections
  • Automated serial sectioning
  • Nanoscale compositional analysis using EDS
  • Texture and crystallographic analysis using EBSD