FIB - FEI Helios G4 PFIB CXe dual beam FIB/SEM - Status: Available
||*ANALYSIS OF RADIOACTIVE SPECIMENS WITH THIS INSTRUMENT IS STRICTLY PROHIBITED*
The FEI Helios G4 PFIB CXe DualBeam system integrates focused ion and scanning electron beams for FIB and SEM functionality in one instrument.
Zoom workshop on dual beam FIB/SEM tips, tricks, and other useful info (recorded 11/19/21)
EBSD Tutorial using EDAX Velocity EBSD camera and TEAM
PFIB lamella prep tutorial
1. Please create an RSC user account with a PI-approved funding source.
2. Please complete RSC general safety training.
3. Please complete the FIB Knowledge Training course through eLearning; submit a training request using the "Training" link at the bottom of the page and follow the instructions to be added to the course; you must complete this course regardless of any prior coursework or operational experience related to SEM or FIB you may have.
Latest Status Log EntryMay 30, 2023 - User Note: New EasyLift needle installed and sharpened; please handle with care
General Contact: firstname.lastname@example.org
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