FIB - FEI Helios G4 PFIB CXe dual beam FIB/SEM - Status: Available
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*ANALYSIS OF RADIOACTIVE SPECIMENS WITH THIS INSTRUMENT IS STRICTLY PROHIBITED*
The FEI Helios G4 PFIB CXe DualBeam system integrates focused ion and scanning electron beams for FIB and SEM functionality in one instrument. Instrument Specifications: Zoom workshop on dual beam FIB/SEM tips, tricks, and other useful info (recorded 11/19/21) EBSD Tutorial using EDAX Velocity EBSD camera and TEAM PFIB lamella prep tutorial TRAINING REQUIREMENTS: 1. Please create an RSC user account with a PI-approved funding source. 2. Please complete RSC general safety training. 3. Please complete the FIB Knowledge Training course through eLearning; submit a training request using the "Training" link at the bottom of the page and follow the instructions to be added to the course; you must complete this course regardless of any prior coursework or operational experience related to SEM or FIB you may have. Latest Status Log EntryMay 30, 2023 - User Note: New EasyLift needle installed and sharpened; please handle with care |
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Equipment image | Download |
Helios G4 PFIB - basic operation SOP | Download |
Helios G4 PFIB - EBSD SOP | Download |
Helios G4 PFIB - lamella recipe | Download |
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