TEM - FEI Themis Z S/TEM - Status: Available
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*ANALYSIS OF RADIOACTIVE SPECIMENS WITH THIS INSTRUMENT IS STRICTLY PROHIBITED*
The FEI Themis Z S/TEM is a state-of-the-art Cs probe-corrected field emission gun scanning/transmission electron microscope capable of providing micro- to atomic-scale structural, morphological, and chemical information. Instrument Specifications:
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- <100 pm resolution HAADF, LAADF, BF, ADF, ABF, DPC, and 4D STEM imaging
- Atomic-resolution energy dispersive and electron energy loss spectroscopy
- High-resolution (0.1 eV) EELS for fine-structure analysis
- Fully automated EDS tomography
- Energy filtered (zero loss, elemental mapping) imaging
- High-resolution (lattice) imaging