TEM - FEI Themis Z S/TEM - Status: Available

  • Current Status: Available
  • Training: View Topics/Sessions
  • Use Rates:
    • External Academic & Government: $120.00/Hour
    • External Affiliated Commercial/Industrial: $225.00/Hour
    • External Commercial/Industrial: $300.00/Hour
    • External International Academic: $160.00/Hour
    • Internal Standard: $50.00/Hour
  • Building: NANO (0070)
  • Room: SPM (137)
  • Room Max Occupancy: 4
  • In Cleanroom: No
  • Main Contact: Nicholas Rudawski
*ANALYSIS OF RADIOACTIVE SPECIMENS WITH THIS INSTRUMENT IS STRICTLY PROHIBITED*

The FEI Themis Z S/TEM is a state-of-the-art Cs probe-corrected field emission gun scanning/transmission electron microscope capable of providing micro- to atomic-scale structural, morphological, and chemical information.

Instrument Specifications:

  • Configured for 60, 200, or 300 kV operation; X-FEG high brightness Schottky field emission gun with monochromator
  • S-twin objective lens with 5.4 mm pole piece gap; tomography, single-, and double-tilt (SoftLoc) holders available; piezo-enhanced CompuStage with 20 pm minimum step size
  • Bottom-mounted FEI Ceta 16 megapixel CMOS camera with speed enhancement; Fischione Instruments Model 3000 HAADF-STEM detector; FEI BF/DF STEM detectors; 4D-STEM and DPC imaging capable
  • <60, <80, and <100 pm STEM resolution at 300, 200, and 60 kV, respectively.
  • Super-X windowless SDD energy dispersive spectroscopy system with 0.7 sr solid angle of collection; fully automated EDS tomography data acquisition
  • Gatan Continuum ER post-column energy filter; DualEELS; BF/DF STEM detectors; 2.5 and 5.0 mm EELS entrance apertures; 9 mm imaging aperture, energy selecting slit
Latest Status Log EntryDec 1, 2021 - User Note: 200kV corrector tuning performed; according to phase plate, convergence angle should be good up to ~25 mrad; 200kV_UF alignment file updated and backed up

  • <100 pm resolution HAADF, LAADF, BF, ADF, ABF, DPC, and 4D STEM imaging
  • Atomic-resolution energy dispersive and electron energy loss spectroscopy
  • High-resolution (0.1 eV) EELS for fine-structure analysis
  • Fully automated EDS tomography
  • Energy filtered (zero loss, elemental mapping) imaging
  • High-resolution (lattice) imaging