S/TEM - FEI Themis Z - Status: Available
  • Current Status: Available
  • Training: View Topics/Sessions
  • Use Rates:
    • External Academic & Government: $120.00/Hour
    • External Affiliated Commercial/Industrial: $225.00/Hour
    • External Commercial/Industrial: $300.00/Hour
    • External International Academic: $144.00/Hour
    • Internal Standard: $80.00/Hour
  • Service: Request Service Quote. The Staff rate is $50/hour (Internal) and $55 /hour (External) in addition to the instrument rate.
  • Building: NANO (0070)
  • Room: SPM (137)
  • In Cleanroom: No
  • Main Contact: Nicholas Rudawski
 *ANALYSIS OF RADIOACTIVE SPECIMENS WITH THIS INSTRUMENT IS STRICTLY PROHIBITED*

The FEI Themis Z S/TEM is a state-of-the-art Cs probe-corrected field emission gun scanning/transmission electron microscope capable of providing micro- to pico-scale structural, morphological, magnetic, and chemical information; it is the most advanced electron microscope of any kind within a 500 mi radius of the University of Florida.

Instrument Specifications:

  • Configured for 60, 200 (default), or 300 kV operation
  • X-FEG high brightness Schottky field emission gun with Wien filter monochromator; ~0.10 eV energy spread with filtering enabled (at 200 kV)
  • Cs probe-corrected (to 5th order) S-twin objective lens with 5.4 mm pole piece gap
  • FEI single-tilt holder, FEI high-visibility, low-background double-tilt (SoftLoc) holder, and Fischione Instruments Model 2021 tomography holder
  • Piezo-enhanced CompuStage with 20 pm minimum step size
  • Bottom-mounted FEI Ceta 16 megapixel CMOS camera with speed enhancement
  • Fischione Instruments Model 3000 HAADF-STEM detector; FEI BF, DF2 (segmented), and DF4 (segmented) STEM detectors for DPC, iDPC, and dDPC imaging
  • High-resolution (lattice) imaging with <0.1 nm information limit
  • <100, <80, and <60 pm STEM resolution at 60, 200, and 300 kV, respectively
  • Dedicated Lorentz lens for TEM mode imaging of magnetic domains; STEM imaging of magnetic domains with ~1 nm resolution enabled by Cs probe-correction and DPC-STEM imaging
  • Super-X windowless SDD energy dispersive spectroscopy system with 0.7 sr solid angle of collection
  • Fully automated TEM, STEM, and STEM-EDS tomography data acquisition
  • Inspect 3D reconstruction and Avizo visualization software for processing and analysis of tomography data (separate onsite workstation)
  • EMPAD 128x128 direct electron detector; single electron sensitivity with 30 bit dynamic range; diffraction pattern recorded at every pixel in a map (4D-STEM) up to 512x512 resolution
  • Gatan Continuum ER post-column energy filter; 2.5 and 5.0 mm entrance apertures for EELS and 9 mm entrance aperture for EFTEM; energy selecting slit for EFTEM; DualEELS; BF/ADF STEM detectors

    • YouTube video demonstrating STEM alignment and <80 pm HAADF-STEM imaging using the Themis Z

    YouTube video demonstrating atomic-scale and nanoscale STEM-EDS mapping using the Themis Z
    Latest Status Log EntryDec 5, 2023 - User Note: LN2 dewar filled
    Capabilities Training Prerequisites Calendar Contacts Docs
    Training TopicDescriptionRatesApprox Session Length (hrs)
    FEI Themis Z S/TEM Base Training – Conventional BF/HR and STEM Imaging; EDS in STEM ModeStandard Rate: $240.00/Complete User Training, No-Charge Rate: $0.00/Complete User TrainingN/A
    FEI Themis Z S/TEM Add-On Training - EELS in STEM Mode (Point Analysis, Linescans, and Maps)Standard Rate: $141.75/Complete User Training, No-Charge Rate: $0.00/Complete User TrainingN/A

    No Scheduled Training Sessions are Currently Available. Please see the option(s) below.

    To request a training session at a custom date & time, please click an option below.

    Request and Sign Up for FEI Themis Z S/TEM Base Training – Conventional BF/HR and STEM Imaging; EDS in STEM Mode | Request and Sign Up for FEI Themis Z S/TEM Add-On Training - EELS in STEM Mode (Point Analysis, Linescans, and Maps) | Request and Sign Up for Priority FEI Themis Z S/TEM Add-On Training - EELS in STEM Mode (Point Analysis, Linescans, and Maps)

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