TEM - FEI Themis Z S/TEM - Status: Down
  • Current Status: Down
  • Training: View Topics/Sessions
  • Use Rates:
    • External Academic & Government: $120.00/Hour
    • External Affiliated Commercial/Industrial: $225.00/Hour
    • External Commercial/Industrial: $300.00/Hour
    • External International Academic: $160.00/Hour
    • Internal Standard: $50.00/Hour
  • Service: Request Service Quote. The Staff rate is $50/hour (Internal) and $55 /hour (External)
  • Building: NANO (0070)
  • Room: SPM (137)
  • In Cleanroom: No
  • Main Contact: Nicholas Rudawski
 *ANALYSIS OF RADIOACTIVE SPECIMENS WITH THIS INSTRUMENT IS STRICTLY PROHIBITED*

The FEI Themis Z S/TEM is a state-of-the-art Cs probe-corrected field emission gun scanning/transmission electron microscope capable of providing micro- to atomic-scale structural, morphological, magnetic, and chemical information.

Instrument Specifications:

  • Configured for 60, 200, or 300 kV operation
  • X-FEG high brightness Schottky field emission gun with monochromator
  • Cs probe-corrected (to 5th order) S-twin objective lens with 5.4 mm pole piece gap
  • FEI single-tilt, double-tilt (SoftLoc), and Fischione Instruments tomography holders available; piezo-enhanced CompuStage with 20 pm minimum step size
  • Bottom-mounted FEI Ceta 16 megapixel CMOS camera with speed enhancement
  • Fischione Instruments Model 3000 HAADF-STEM detector; FEI BF, DF2 (segmented), and DF4 (segmented) STEM detectors for DPC imaging
  • <60, <80, and <100 pm STEM resolution at 300, 200, and 60 kV, respectively
  • High-resolution (lattice) imaging with <0.1 nm information limit
  • Dedicated Lorentz lens for Lorentz TEM and STEM imaging of magnetic specimens; ~1 nm Lorentz STEM resolution enabled by Cs probe-correction
  • Super-X windowless SDD energy dispersive spectroscopy system with 0.7 sr solid angle of collection; fully automated EDS tomography data acquisition
  • Electron Microscope Pixelated Array Detector (EMPAD); 128x128 direct electron detector with 150 um pixel size; single electron sensitivity with 30 bit dynamic range; diffraction pattern recorded at every point in a map (4D-STEM)
  • Gatan Continuum ER post-column energy filter; DualEELS; BF/DF STEM detectors; 2.5 and 5.0 mm EELS entrance apertures; 9 mm imaging aperture, energy selecting slit
Latest Status Log EntryJul 1, 2022 - Resource Status Down - 72 h cryo cycle in progress
Capabilities Training Prerequisites Calendar Contacts Docs
Training TopicDescriptionRatesApprox Session Length (hrs)
FEI Themis Z S/TEM Base Training – Conventional and STEM Imaging; STEM-EDSStandard Rate: $240.00/Complete User Training, No-Charge Rate: $0.00/Complete User TrainingN/A

No Scheduled Training Sessions are Currently Available. Please see the option(s) below.

To request a training session at a custom date & time, please click an option below.

Request and Sign Up for FEI Themis Z S/TEM Base Training – Conventional and STEM Imaging; STEM-EDS