S/TEM - FEI Themis Z - Status: Available
||*ANALYSIS OF RADIOACTIVE SPECIMENS WITH THIS INSTRUMENT IS STRICTLY PROHIBITED*
The FEI Themis Z S/TEM is a state-of-the-art Cs probe-corrected field emission gun scanning/transmission electron microscope capable of providing micro- to pico-scale structural, morphological, magnetic, and chemical information; it is the most advanced electron microscope of any kind within a 500 mi radius of the University of Florida.
YouTube video demonstrating STEM alignment and <80 pm HAADF-STEM imaging using the Themis Z
YouTube video demonstrating atomic-scale and nanoscale STEM-EDS mapping using the Themis Z
Latest Status Log EntryDec 5, 2023 - User Note: LN2 dewar filled
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