SPM/AFM Dimension 3100 - Status: Available

  • Current Status: Available
  • Use Rates:
    • External Academic & Government: $60.00/Hour
    • External Affiliated Commercial/Industrial: $112.50/Hour
    • External Commercial/Industrial: $150.00/Hour
    • External International Academic: $80.00/Hour
    • Internal Standard: $40.00/Hour
  • Service: Request Service Quote. The Staff rate is $50/hour
  • Building: NANO (0070)
  • Room: Particle Analysis 4 (239)
  • In Cleanroom: No
  • Main Contact: rscinfo@mail.ufl.edu
Scanning Probe Microscope/ Atomic Force Microscope
AFM is a high resolution, nano meter scale, type of Scanning Probe Microscopy.
A stylus or probe is moved across a solid surface following the contours of the
topography and provides a three dimensional image of the surface.Latest Status Log EntryJan 24, 2020 - User Note: will forward work time to one of Dr.Moudgil's projects after review.

Scanning Probe Microscope/ Atomic Force Microscope
The Digital Instruments Dimension 3100 AFM can provide imaging in both contact
and tapping modes and the sample stage can handle up to a 150 mm diameter wafer.
Adhesive or repulsive forces between a surface and the tip
can be measured as well as between a small particle attached to the tip and a surface.

Available Dimension 3100 Consumables: Tapping Mode Tips