SPM/AFM Dimension 3100 - Status: Available
||Scanning Probe Microscope/ Atomic Force Microscope
AFM is a high resolution, nano meter scale, type of Scanning Probe Microscopy.
A stylus or probe is moved across a solid surface following the contours of the
topography and provides a three dimensional image of the surface.Latest Status Log EntryJan 24, 2020 - User Note: will forward work time to one of Dr.Moudgil's projects after review.
Scanning Probe Microscope/ Atomic Force Microscope
The Digital Instruments Dimension 3100 AFM can provide imaging in both contact
and tapping modes and the sample stage can handle up to a 150 mm diameter wafer.
Adhesive or repulsive forces between a surface and the tip
can be measured as well as between a small particle attached to the tip and a surface.
Available Dimension 3100 Consumables: Tapping Mode Tips