SPM/AFM Dimension 3100 - Status: Available
||Scanning Probe Microscope/ Atomic Force Microscope
AFM is a high resolution, nano meter scale, type of Scanning Probe Microscopy.
A stylus or probe is moved across a solid surface following the contours of the
topography and provides a three dimensional image of the surface.Latest Status Log EntryOct 3, 2022 - Resource Status Up - Up from Hurricane Ian shutdown.
|Computer Access||Requires computer access be setup||Check Your Status|
|Funding Source||Requires permission to an active funding source||Check Your Status|
|Work Plan||Requires a work plan be approved by PI and staff||Check Your Status|
|Agreement Form||Requires completed agreement form for equipment usage||Check Your Status|
|RSC Safety Training||Requires completion of safety training||Check Your Status|
|NRF Building Access||Requires issue of an id badge and entry badge and/or access level to be set.||Check Your Status|
|Equipment Training||Requires completion of equipment training||Check Your Status|
|Equipment Notice & Agreement||Requires agreement to equipment notice.||Check Your Status|
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