Ellipsometer, J.A. Woolam - Status: Available
||The ellipsometer is able to measure the refractive index and the thickness of semi-transparent thin films. It can be used to measure layers as thin as 1 nm up to layers which are one micron thick. Applications include the accurate thickness measurement of thin films, the identification of materials and thin layers and the characterization of surfaces.
Ellipsometry wiki link Latest Status Log EntrySep 13, 2017 - Resource Status Up - restart after storm
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