Ellipsometer, J.A. Woolam - Status: Available

  • Current Status: Available
  • Use Rates:
    • External Academic & Government: $30.00/Hour
    • External Affiliated Commercial/Industrial: $30.00/Hour
    • External Commercial/Industrial: $40.00/Hour
    • External International Academic: $40.00/Hour
    • Internal Standard: $20.00/Hour
  • Service: Request Service Quote. The Staff rate is $50/hour
  • Building: NANO (0070)
  • Room: Device Assembly & Processing (122)
  • In Cleanroom: No
  • Main Contact: David Hays
The ellipsometer is able to measure the refractive index and the thickness of semi-transparent thin films. It can be used to measure layers as thin as 1 nm up to layers which are one micron thick. Applications include the accurate thickness measurement of thin films, the identification of materials and thin layers and the characterization of surfaces.

Ellipsometry wiki link Latest Status Log EntrySep 13, 2017 - Resource Status Up - restart after storm

Use Prerequisites

PrerequisiteDescription
Computer AccessRequires computer access be setup
Funding SourceRequires permission to an active funding source
Work PlanRequires a work plan be approved by PI and staff
Agreement FormRequires completed agreement form for equipment usage
RSC Safety TrainingRequires completion of safety training
NRF Building AccessRequires issue of an id badge and entry badge and/or access level to be set.
Equipment TrainingRequires completion of equipment training

View your prerequisite status for the Ellipsometer, J.A. Woolam.