Ellipsometer, J.A. Woolam - Status: Available

The ellipsometer is able to measure the refractive index and the thickness of semi-transparent thin films. It can be used to measure layers as thin as 1 nm up to layers which are one micron thick. Applications include the accurate thickness measurement of thin films, the identification of materials and thin layers and the characterization of surfaces.

Ellipsometry wiki link Latest Status Log EntryMar 26, 2021 - User Note: calibration wafer had something smeared on it and would not calibrate. Cleaned the wafer and it is working now.
Contact LevelNameEmail
1Hays, Daviddhays@nimet.ufl.edu

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