Ellipsometer, J.A. Woolam - Status: Available
  • Current Status: Available
  • Training: View Topics/Sessions
  • Use Rates:
    • External Academic & Government: $31.50/Hour
    • External Affiliated Commercial/Industrial: $31.50/Hour
    • External Commercial/Industrial: $42.00/Hour
    • External International Academic: $42.00/Hour
    • Internal Standard: $21.00/Hour
  • Service: Request Service Quote. The Staff rate is $50/hour (Internal) and $55 /hour (External) in addition to the instrument rate.
  • Building: NANO (0070)
  • Room: Device Assembly & Processing (122)
  • In Cleanroom: No
  • Main Contact: David Hays
 The ellipsometer is able to measure the refractive index and the thickness of semi-transparent thin films. It can be used to measure layers as thin as 1 nm up to layers which are one micron thick. Applications include the accurate thickness measurement of thin films, the identification of materials and thin layers and the characterization of surfaces.

Ellipsometry wiki link Latest Status Log EntryJan 2, 2024 - Resource Status Up - Ready to use
Capabilities Training Prerequisites Calendar Contacts Docs
Training TopicDescriptionRatesApprox Session Length (hrs)
Ellipsometer J.A. Woolam TrainingStandard Rate: $39.00/Complete User Training1
StartEndAvailabilityLocation
Tue, Apr. 30, 2024 9:00 AMTue, Apr. 30, 2024 10:00 AM1 Seats out of 1NRFSign Up
Mon, May. 13, 2024 1:30 PMMon, May. 13, 2024 2:30 PM1 Seats out of 1NRFSign Up
Tue, May. 28, 2024 9:00 AMTue, May. 28, 2024 10:00 AM1 Seats out of 1NRFSign Up
Mon, Jun. 10, 2024 1:30 PMMon, Jun. 10, 2024 2:30 PM1 Seats out of 1NRFSign Up
Tue, Jun. 25, 2024 9:00 AMTue, Jun. 25, 2024 10:00 AM1 Seats out of 1NRFSign Up

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