Equipment by Name

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Display by: Name Keywords
Show: All Characterization Fabrication NRF MAIC PAIC Search Resources: Clear Search
Name Status Keywords
4 Point Probe Station Available Metrology
Aberration Corrected S/TEM JEM-ARM200cF (NHMFL - FSU) Down Electron Microscopy/Microan...
ALD - Cambridge Nano Fiji 200 Available Film Deposition
Amerimade Bench BOE/HF Available Wet Processing
Amerimade Bench SC1/SC2 Available Wet Processing
Asher, Anatech Barrel SCE600 Available Plasma
Brookhaven ZetaPlus Up Particle Analysis/Character...
Bruker Optical Profilometer Available Metrology, Surface Analysis...
Cameca SX Five FE EPMA Up Electron Microscopy/Microan...
Coater - Carbon Up Other
Coater - Hummer V Au-Pd Up Other
Coater - SPI Au-Pd Up Other
Colloidal Dynamics Acoustosizer IIs Down Particle Analysis/Character...
Coulter LS13320 Up Particle Analysis/Character...
Coulter Multisizer III Down Particle Analysis/Character...
Critical Point Dryer Available Wet Processing
Deep RIE, STS Down Plasma
Dicing Saws- ADT Available Dicing/Bonding
E-beam evaporator, PVD Available Film Deposition
Electron microscope, JEOL 5700 Available Metrology
Electronic Measurement, Lakeshore 7507 Available Metrology
Ellipsometer, J.A. Woolam Available Metrology, Surface Analysis...
FEI Helios NanoLab 600 dual beam FIB/SEM Up Electron Microscopy/Microan...
FEI Tecnai F20 S/TEM Up Electron Microscopy/Microan...
Flexus 2320 Available Metrology
FTIR/FT-Raman/FTIR Microscope - Thermo Electron Magna 760 Up Spectroscopy
Furnace Tube, Thermcraft, General Hot Process Available Hot Processing
Furnace Tube, Tystar #1 Wet and dry Ox Available Hot Processing
General Acids/Bases Bench-Left Available Wet Processing
General Acids/Bases Bench-Right Up Wet Processing
Heidelberg Laser Writer In Use Photolithography
Horiba microRaman Available Metrology, Spectroscopy
JCPDS Available X-Ray Analysis/Characteriza...
JEOL 2010F S/TEM Available Electron Microscopy/Microan...
JEOL Superprobe 733 Available Electron Microscopy/Microan...
JST Wet Bench Available Wet Processing
K&S 4124 Ball Bonder, Gold Ball Available Dicing/Bonding
K&S 4700 Wedge Bonder (Staff Run) Available Dicing/Bonding
Labconco Freeze Dryer Up Sample Preparation
Litho Process EVG Model 620 w/BSA Available Photolithography
Litho Process Headway E-Beam Bay & Hot Plate/Oven Available Photolithography
Litho Process Karl Suss MA6 In Use Photolithography
Litho Process Laurell Litho Bay & Hot Plate/Oven Available Photolithography
Litho Process Laurell Spinner E-Beam Bay & Hot Plate/Oven Available Photolithography
Litho Process Suss Delta 80 & Hot Plate/Oven Available Photolithography
Logitech PM5 Polisher Available Other
Mettler Toledo TGA Up Other Analytical Techniques
Micro Manipulator Available Sample Preparation
Microtrac Nanotrac Up Particle Analysis/Character...
Nano-CT - GE v|tome|x m 240 In Use X-Ray Analysis/Characteriza...
Nano-CT Image Processing/Reconstruction System In Use X-Ray Analysis/Characteriza...
Nikon LV100 Microscope In Use Metrology
Objet 3D Printer Up 3D Printing
Optical Microscope - Olympus BX60 with SPOT Insight Digital Camera Up Surface Analysis/Characteri...
Oven, YES, Image Reversal/HMDS Available Photolithography
Oxford Plasma Pro 100 RIE Down Plasma
Paar Physica Electro Kinetic Analyzer Down Particle Analysis/Character...
Panalytical XPert MRD Down X-Ray Analysis/Characteriza...
Panalytical XPert Powder Available X-Ray Analysis/Characteriza...
PECVD, STS 310PC SiO2 - SiN - Amorphous Si Available Film Deposition
Perkin Elmer 5100 XPS System Available Surface Analysis/Characteri...
Perkin-Elmer PHI 660 - AES Available Surface Analysis/Characteri...
Photospectrometer, Filmetrics F40 Available Metrology
Profilometer, Dektak 150 Available Metrology
Profilometer, Tencor AS500 Available Metrology
Quantachrome PoreMaster Mercury Porosimeter Up Porosimetry/Porometry/Surfa...
Quantachrome Porometer 3g zh Available Porosimetry/Porometry/Surfa...
Quantachrome Ultrapyc 1000 Gas Pycnometer Up Porosimetry/Porometry/Surfa...
Raith 150, e-beam lithography Available Photolithography
Raith ionLiNE - multi-species FIB Available Other
Rheometer - ARES LS1 Down Other Analytical Techniques
RIE/ICP, Unaxis SLR In Use Plasma
RTA, SSI Solaris 150 Available Hot Processing
RTA, Steag 100CS RTP Available Hot Processing
SCS Parylene Coater Available Film Deposition
SEM - FEI Nova 430 w/EDS & CL In Use Electron Microscopy/Microan...
Solvent Bench #1 Lift Off Available Wet Processing
Solvent Bench #1 PR Strip In Use Wet Processing
Solvent Bench 2 - hot plate and workspace Up Wet Processing
Spin Dryer - Sitek Available Other
SPM/AFM Dimension 3100 Down Surface Analysis/Characteri...
Sputter Deposition, KJL CMS-18 Multi-Source Available Film Deposition
Tepla Asher M4L Down Plasma
Tescan MIRA3 SEM Up Electron Microscopy/Microan...
Trion RIE/ICP Available Plasma
TSI PSD 3603 (Aerosizer) Down Particle Analysis/Character...
ULVAC-PHI XPS Available Surface Analysis/Characteri...
Unaxis 790 RIE Available Plasma
VP-SEM S-3000 Down Electron Microscopy/Microan...
Wafer Bonder, EVG 501 Down Hot Processing
Wenesco Hotplate Available Other
Zeta Reader Mark 21 Up Particle Analysis/Character...